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Speckle metrology / edited by Rajpal S. Sirohi. by Series: Optical engineering (Marcel Dekker, Inc.) ; v. 38.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Marcel Dekker, c1993
Online access:
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 620.1127 SIR/S1.
Speckle metrology / edited by Rajpal S. Sirohi. by Series: Optical engineering (Marcel Dekker, Inc.) ; v. 38.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Marcel Dekker, c1993
Online access:
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 620.1127 SIR/S.
Holographic and speckle interferometry : a discussion of the theory, practice, and application of the techniques / Robert Jones, Catherine Wykes. by Series: Cambridge studies in modern optics ; 6
Edition: 2nd ed.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Cambridge [England] ; New York : Cambridge University Press, 1989
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.3675 JON/H.
Interferometry in speckle light : theory and applications : proceedings of the international conference 25-28 September 2000, Lausanne, Switzerland / P. Jacquot, J.-M. Fournier (eds.). by
Material type: Text Text
Publication details: Berlin ; New York : Springer, 2000
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 535.2 JAC/I.
Digital speckle pattern interferometry and related techniques / edited by P.K. Rastogi. by
Material type: Text Text
Publication details: Chichester ; New York : Wiley, c2001
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.3675 RAS/D.
Speckle photography for fluid mechanics measurements / Nikita A. Fomin. by
Material type: Text Text
Publication details: Berlin ; New York : Springer, c1998
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 681/.28 FOM/S.
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