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Speckle metrology / edited by Rajpal S. Sirohi.

Contributor(s): Material type: TextTextSeries: Optical engineering (Marcel Dekker, Inc.) ; v. 38.Publication details: New York : Marcel Dekker, c1993.Description: xiii, 551 p. : ill. ; 24 cmISBN:
  • 0824789326 (acidfree paper)
Subject(s): DDC classification:
  • 620.1127 SIR/S
LOC classification:
  • TA417.2 .S66 1993
Online resources:
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Holdings
Item type Current library Home library Call number Copy number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics 620.1127 SIR/S1 (Browse shelf(Opens below)) 1 Available DOP3323

Includes bibliographical references and index.

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