Physical principles of Electron Microscopy : An Introduction to TEM, SEM, AND AEM ; Egerton, R F.

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Material type: Text

TextPublication details: Switzerland : Springer, 2016.Edition: 2NDDescription: vii, 196 pISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Copy number	Status	Date due	Barcode
Book	Dept. of Nanoscience and Nanotechnology General Stacks	Dept. of Nanoscience and Nanotechnology	Text Book	502.825 (Browse shelf(Opens below))	EGE/P	Available		DNT1702

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	502.225 WIL/T Transmission Electron Microscopy: A Textbook for Materials Science/	502.82 Scanning Probe Microscopy for Energy Research;	502.825 Physical principles of Electron Microscopy : An Introduction to TEM, SEM, AND AEM ;	518.6 Introductory Methodsb of Numerical Analysis ;	518.6 Introductory Methodsb of Numerical Analysis ;	519.4 Introductory Methods of Numerical Analysis/	Next

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