Amazon cover image
Image from Amazon.com
Image from Google Jackets
Image from OpenLibrary

Physical principles of Electron Microscopy : An Introduction to TEM, SEM, AND AEM ; Egerton, R F.

By: Material type: TextTextPublication details: Switzerland : Springer, 2016.Edition: 2NDDescription: vii, 196 pISBN:
  • 978-3-319-81986-0
DDC classification:
  • 2nd 502.825
Tags from this library: No tags from this library for this title. Log in to add tags.
Holdings
Item type Current library Home library Collection Call number Copy number Status Date due Barcode
Book Book Dept. of Nanoscience and Nanotechnology General Stacks Dept. of Nanoscience and Nanotechnology Text Book 502.825 (Browse shelf(Opens below)) EGE/P Available DNT1702

There are no comments on this title.

to post a comment.