Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9780387258003
- 0387258000
- 502.825
Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
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Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 502.825 EGE/P (Browse shelf(Opens below)) | Available | DOP1041 |
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502.82 HAW.1/S Science of microscopy. Vol.1 / | 502.82 HAW.2/S Science of microscopy. Vol.1 / | 502.825 BHA/I Instrumentations and nanostructures/ | 502.825 EGE/P Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / | 510 RIL/F Foundation mathematics for the physical sciences | 510 WAL/B A beginner's guide to discrete mathematics / | 514/.742 ADD/F Fractals and chaos : an illustrated course / |
Includes bibliographical references (p. [195]-196) and index.
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