Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.
Material type: TextPublication details: New York, NY : Springer, c2005.Description: xii, 202 p. : illISBN:- 9780387258003
- 0387258000
- 502.825
Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Book | Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 502.825 EGE/P (Browse shelf(Opens below)) | Available | DOP1041 |
Includes bibliographical references (p. [195]-196) and index.
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