| 000 | 00432nam a2200181 4500 | ||
|---|---|---|---|
| 020 |
_a _c |
||
| 082 | _a570.282 SIE-P | ||
| 100 | _aSiegel, Benjamin M, Ed.; Beaman, Donald R | ||
| 245 | _aPhysical aspects of electron microscopy and microbeam analysis | ||
| 250 | _a | ||
| 260 |
_aJohn Wiley & Sons, New York _c1975 |
||
| 300 | _a | ||
| 490 | _a | ||
| 500 | _a | ||
| 590 |
_aVIN _b _c |
||
| 650 | _aMicroscopy | ||
| 942 | _cBK | ||
| 999 |
_c544891 _d544891 |
||