| 000 | 00469nam a2200181 4500 | ||
|---|---|---|---|
| 020 |
_a9783540232490 _c |
||
| 082 | _a620.11295 SCH-I | ||
| 100 | _aSchubert, Mathias | ||
| 245 | _aInfrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons | ||
| 250 | _a | ||
| 260 |
_aSpringer (India) Pvt. Ltd., New Delhi _c2004 |
||
| 300 | _a190 | ||
| 490 | _a | ||
| 500 | _a | ||
| 590 |
_aGimish _b _c |
||
| 650 | _aEllipsometry | ||
| 942 | _cBK | ||
| 999 |
_c482151 _d482151 |
||