| 000 | 00905cam a22002537a 4500 | ||
|---|---|---|---|
| 020 | _a9789814322805 (set) | ||
| 020 | _a9814322806 (set) | ||
| 020 | _a9789814322812 (v. 1) | ||
| 020 | _a9814322814 (v. 1) | ||
| 020 | _a9789814322829 (v. 2) | ||
| 020 | _a9814322822 (v. 2) | ||
| 082 | 0 | 4 | _a620.115 HAI/H |
| 245 | 0 | 0 |
_aHandbook of instrumentation and techniques for semiconductor nanostructure characterization / _ceditors, Richard Haight, Frances M. Ross, James B. Hannon. |
| 260 |
_aSingapore ; _aHackensack, NJ : _bWorld Scientific, _cc2012. |
||
| 300 |
_a2 v. : _bill. (some col.) ; |
||
| 490 | 1 | _aWorld Scientific series in materials and energy ; | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aNanostructured materials. | |
| 650 | 0 | _aNanotechnology. | |
| 700 | 1 | _aHaight, Richard. | |
| 700 | 1 | _aRoss, Frances M. | |
| 700 | 1 | _aHannon, James B. | |
| 942 | _cBK | ||
| 999 |
_c454070 _d454070 |
||