000 | 00760cam a22002174a 4500 | ||
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999 |
_c452715 _d452715 |
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020 | _a0849336821 (alk. paper) | ||
020 | _a9780849336829 | ||
082 | 0 | 0 | _a670.42/5 |
245 | 0 | 0 |
_aOptical inspection of microsystems / _cedited by Wolfgang Osten. |
260 |
_aBoca Raton, FL : _bCRC/Taylor & Francis, _cc2007. |
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300 |
_a503 p., [8] p. of plates : _bill. (some col.) ; |
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490 | 1 | _aOptical science and engineering ; | |
504 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aMicroelectromechanical systems | |
650 | 0 | _aQuality control | |
650 | 0 | _aOptical measurements. | |
650 | 0 | _aIndustrial microscopy. | |
700 | 1 | _aOsten, Wolfgang. | |
856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0648/2005046670-d.html |
942 | _cBK |