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Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. by
Material type: Text Text
Publication details: Weinheim : Wiley-VCH, c2006
Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 530.4275 BIR/T.
Worked examples in x-ray analysis by Series:
Edition: 2
Material type: Text Text
Publication details: Macmillan Press Ltd., London 1978
Availability: Items available for loan: Dept. of Physics (1)Call number: 544.66 JEN-W2.
Quantitative x-ray spectrometry by Series:
Edition: 2
Material type: Text Text
Publication details: Marcel Dekker, INC. New York 1995
Availability: Items available for loan: Dept. of Physics (1)Call number: 545.836 JEN-Q2.
x-ray absorption spectroscopy of semiconductors by Series:
Edition:
Material type: Text Text
Publication details: Springer 2015
Availability: Items available for loan: Dept. of Physics (1)Call number: 621.31852 CLA-X.
X-ray absorption and X-ray emission spectroscopy : theory and applications / edited by Jeroen A. van Bokhoven and Carlo Lamberti. by
Material type: Text Text
Availability: Items available for loan: IUCEIB Library, University of Kerala (2)Call number: 522.686 VAN.X.1, ...
Radiation detection systems. edited by Jan Iwanczyk,& Krzysztof Iniewski. by Series: Devices, circuits, and systems
Edition: Second edition.
Material type: Text Text
Publication details: LONDON: CRC, 2022
Availability: Items available for loan: Campus Library Kariavattom (1)Call number: 539.77 IWA.R.2.
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