Handbook of instrumentation and techniques for semiconductor nano structure characterization. Vol. 2/ edited by Richard Haight, Frances M. Ross and James B. Hannon
Material type: TextSeries: World Scientific Series in Materials and Energy/edited by Leonard C. FeldmanPublication details: Singapore: World Scientific Publishing Co. , 2012Description: 610pISBN:- 9789814322829
- 620.115
Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Book | Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 620.115 HAI.2/H (Browse shelf(Opens below)) | Available | DOP2268 |
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