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Handbook of instrumentation and techniques for semiconductor nano structure characterization. Vol. 2/ edited by Richard Haight, Frances M. Ross and James B. Hannon

By: Contributor(s): Material type: TextTextSeries: World Scientific Series in Materials and Energy/edited by Leonard C. FeldmanPublication details: Singapore: World Scientific Publishing Co. , 2012Description: 610pISBN:
  • 9789814322829
Subject(s): DDC classification:
  • 620.115
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics Non-fiction 620.115 HAI.2/H (Browse shelf(Opens below)) Available DOP2268

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