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Common errors in statistics (and how to avoid them) / by Phillip I Good and James W Hardin336p. :

By: Contributor(s): Material type: TextTextPublication details: Hoboken : Wiley, 2012.Edition: Fourth editionDescription: 336pISBN:
  • 9781118360118 (ePub)
  • 9781118360095 (MobiPocket)
  • 9781118360132 ( Adobe PDF)
Subject(s): DDC classification:
  • 519.5 GOO
Summary: "The Fourth Edition of this tried-and-true book elaborates on many key topics such as epidemiological studies, distribution of data; baseline data incorporation; case control studies; simulations; statistical theory publication; biplots; instrumental variables; ecological regression; result reporting, survival analysis; etc. Including new modifications and figures, the book also covers such topics as research plan creation; data collection; hypothesis formulation and testing; coefficient estimates; sample size specifications; assumption checking; p-values interpretations and confidence intervals; counts and correlated data; model building and testing; Bayes' Theorem; bootstrap and permutation tests; and more"--
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Holdings
Item type Current library Home library Call number Status Date due Barcode
Book Book Dept. of Statistics Processing Center Dept. of Statistics 519.5 GOO (Browse shelf(Opens below)) Available STA9959

Includes bibliographical references and index.

"The Fourth Edition of this tried-and-true book elaborates on many key topics such as epidemiological studies, distribution of data; baseline data incorporation; case control studies; simulations; statistical theory publication; biplots; instrumental variables; ecological regression; result reporting, survival analysis; etc. Including new modifications and figures, the book also covers such topics as research plan creation; data collection; hypothesis formulation and testing; coefficient estimates; sample size specifications; assumption checking; p-values interpretations and confidence intervals; counts and correlated data; model building and testing; Bayes' Theorem; bootstrap and permutation tests; and more"--

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