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Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. by
Material type: Text Text
Publication details: Weinheim : Wiley-VCH, c2006
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Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 530.4275 BIR/T.
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X-ray scattering from semiconductors by Series:
Edition:
Material type: Text Text
Publication details: Imperial College Press, London 2000
Availability: Items available for loan: Dept. of Physics (1)Call number: R 537.535 FEW-X.
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