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		Neural networks and artificial intelligence for biomedical engineering / Donna L. Hudson, Maurice E. Cohen. by Hudson, D. L Cohen, M. E Material type: Text Publication details: New York : Institute of Electrical and Electronics Engineers, c2000 Online access: Online Resource Online Resource Online Resource Availability: Items available for loan: Dept. of Futures Studies (1)Call number: 610 HUD. Place hold Add to cart (remove)
		Fuzzy models for pattern recognition : methods that search for structures in data / edited by James C. Bezdek, Sankar K. Pal. by Bezdek, James C Pal, Sankar K Material type: Text Publication details: New York : Institute of Electrical and Electronics Engineers, c1992 Availability: Items available for loan: Dept. of Futures Studies (1)Call number: 006.4 FUZ. Place hold Add to cart (remove)
		Microsystems technology for multimedia applications : an introduction / edited by Bing Sheu ... [et al.]. Material type: Text Publication details: New York : Institute of Electrical and Electronics Engineers, c1995 Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.399 SHE/M. Place hold Add to cart (remove)
		Optical networking II : analysis, signaling, QoS and network management : selected readings/ Mehmet Toy by Toy, Mehmet Material type: Text Publication details: New Jersy: The Institute of Electrical and Electronics Engineers, Inc. 2001 Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.3827 TOY/O. Place hold Add to cart (remove)
		Optical networking I : architectures, devices, cross connects and switches : selected readings/ Edited by Mehmet Toy by Toy, Mehmet Material type: Text Publication details: New Jercy: The Institute of Electrical and Electronics Engineers Inc., 2001 Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.3827 TOY/O. Place hold Add to cart (remove)
		Frequency stability : fundamentals & measurement / edited by Vĕnceslav F. Kroupa. by Kroupa, Venceslav F Material type: Text Publication details: New York : Institute of Electrical and Electronics Engineers, 1983 Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.3747 KRO/F. Place hold Add to cart (remove)
		Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma. by Sharma, Ashok K Material type: Text Publication details: New York : Hoboken, N.J. : IEEE, the Institute of Electrical and Electronics Engineers ; Wiley-Interscience, c1997 Online access: Online Resource Online Resource Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.39732 SHA/S. Place hold Add to cart (remove)
		The new IEEE standard dictionary of electrical, electronics and computer terms : (including abstracts of all current IEEE standards) / Gediminas P. Kurpis, chair ; Christopher J. Booth, editor. by Booth, Christopher J Kurpis, Gediminas P Edition: 5th ed. Material type: Text Publication details: New York, NY, USA : Institute of Electrical and Electronics Engineers, c1994 Availability: Items available for loan: Dept. of Optoelectronics (1)Call number: 621.303. Place hold Add to cart (remove)