TY  - BOOK
AU  - Schwartz,Adam J.
TI  - Electron backscatter diffraction in materials science
SN  - 9780387881355 (alk. paper)
PY  - 2009///
CY  - New York
PB  - Springer
KW  - Materials
KW  - Scanning electron microscopy
KW  - Crystallography
KW  - Elektronenbeugung
KW  - Kristallographie
KW  - Rückstreuung
N1  - Includes bibliographical references and index
ER  -