Electron backscatter diffraction in materials science / 
Adam J. Schwartz ... [et al.], eds. 
 - 2nd ed. 
 - New York :  Springer,  c2009. 
 - xxii, 403 p. :  ill. (some col.) ; 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780387881355 (alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials<br/>Scanning electron microscopy.<br/>Crystallography.<br/>Elektronenbeugung.<br/>Kristallographie.<br/>Rückstreuung.