Siegel, Benjamin M, Ed.; Beaman, Donald R <br/><br/>
Physical aspects of electron microscopy and microbeam analysis 

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 - John Wiley & Sons, New York  1975 
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<br/><br/><label>ISBN: </label>  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy
<br/><br/><label>Dewey Class. No.: </label>570.282  SIE-P