TY  - BOOK
AU  - Holt, D. B. and Yacobi, B. G.
TI  - Extended defects in semiconductors: electronic properties, device effects and structures
SN  - 9780521819343
U1  - 620.38152  HOL-E 
PY  - 2007///
CY  - Cambridge University Press, London
KW  - Semiconductors--Defects
ER  -