TY  - BOOK
AU  - Gault, Baptiste et.al
TI  - Atom probe microscopy
T2  - Springer series in materials science 160
SN  - 9781461434351
U1  - R  620.5  GAU-A 
PY  - 2012///
CY  - Springer
KW  - Atom- probe field ion microscopy
ER  -