Gault, Baptiste et.al <br/><br/>
Atom probe microscopy 

 - 
 - Springer  2012 
 - 396 
 - Springer series in materials science 160 .
<br/><br/>  
<br/><br/><label>ISBN: </label>9781461434351  11643.52 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atom- probe field ion microscopy
<br/><br/><label>Dewey Class. No.: </label>R  620.5  GAU-A