TY  - BOOK
AU  - Schubert, Mathias
TI  - Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
SN  - 9783540232490
U1  - 620.11295  SCH-I 
PY  - 2004///
CY  - Springer (India) Pvt. Ltd., New Delhi
KW  - Ellipsometry
ER  -