Schubert, Mathias <br/><br/>
Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons 

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 - Springer (India) Pvt. Ltd., New Delhi  2004 
 - 190 
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<br/><br/><label>ISBN: </label>9783540232490   
<br/><br/><label>Subjects--Topical Terms: </label><br/>Ellipsometry
<br/><br/><label>Dewey Class. No.: </label>620.11295  SCH-I