TY  - BOOK
AU  - Wojnar,Leszek
TI  - Image analysis: applications in materials engineering 
T2  - CRC series in materials science and technology
SN  - 0849382262 (alk. paper)
U1  - 620.1102 
PY  - 1999///
CY  - Boca Raton, FL
PB  - CRC Press
KW  - Materials
KW  - Image analysis
KW  - Image processing
N1  - Includes bibliographical references (p. [227]-233) and index
UR  - http://www.loc.gov/catdir/enhancements/fy0744/98034435-d.html
ER  -