Classification, pattern recognition, and reduction of dimensionality / 
edited by P.R. Krishnaiah, L.N. Kanal. 
 - Amsterdam ;  New York :  New York, N.Y. :  North-Holland Pub. Co. ;  Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.,  c1982. 
 - xxii, 903 p. :  ill. ; 
<br/><br/>Includes bibliographies and index. 
<br/><br/><label>ISBN: </label>044486217X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Discriminant analysis.<br/>Cluster analysis.<br/>Pattern perception.
<br/><br/><label>Dewey Class. No.: </label>519.535  / HAN.H