Bain, Lee J <br/><br/>
Statistical analysis of reliability and life-testing models :   theory and methods / 
by Lee J Bain and Max Engelhardt 
 - 2nd ed. 
 - New York :  Marcel Dekker,  1991. 
 - 496p. : 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Statistical analysis
<br/><br/><label>Dewey Class. No.: </label>620.00452  / BAI.S