Size effects in thin films

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Material type: Text

TextSeries: Publication details: Elsevier Publishing Co., New York 1982Edition: Description: 310ISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Date due	Barcode
Book	Dept. of Physics Processing Center	Dept. of Physics	530.41 TEL-S (Browse shelf(Opens below))	Available		PHY4294

Previous	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available	No cover image available No cover image available		Next
Previous	530.41 SSS-F.93 Springer series in solid-state sciences, Vol.93: Quasicrystals	530.41 SSS-H.83 Springer series in solid-state sciences, Vol.83: Physics and technology of submicron structures	530.41 TAY-Q Quantum approach to the solid state	530.41 TEL-S Size effects in thin films	530.41 TOM-P Physics of solids at high pressures	530.41 TRU-U Ultrasonic methods in solid state physics	530.41 WAH-S Solid state physics: structure and properties of materials	Next

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