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Microstructural characterization of materials / David Brandon and Wayne Kaplan.

By: Contributor(s): Material type: TextTextSeries: Quantitative software engineering seriesPublication details: Chichester, England : John Wiley & Sons, c2006.Edition: 2nd edDescription: xiv, 536 p. : ill. (some col.)ISBN:
  • 9780470027844 (cloth)
Subject(s): DDC classification:
  • 620.11299
Online resources:
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics Reference 620.11299 BRA/M (Browse shelf(Opens below)) Available DOP1663

Includes bibliographical references and index.

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