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Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon.

Contributor(s): Material type: TextTextSeries: Publication details: Singapore ; Hackensack, NJ : World Scientific, c2012.Description: 2 v. : ill. (some col.)ISBN:
  • 9789814322805 (set)
  • 9814322806 (set)
  • 9789814322812 (v. 1)
  • 9814322814 (v. 1)
  • 9789814322829 (v. 2)
  • 9814322822 (v. 2)
Subject(s): DDC classification:
  • 620.115 HAI/H
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics Reference 620.115 HAI.1/H (Browse shelf(Opens below)) Available DOP2267

Includes bibliographical references and index.

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