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Semiconductor device and failure analysis: using photon emission microscopy/ Wai Kin Chim
Material type:
TextPublication details: Chichester: John Wiley & Sons, 2000Description: 269pISBN: - 9780471492405
- 621.38152 CHI/S
| Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
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Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 621.38152 CHI/S (Browse shelf(Opens below)) | Available | DOP1308 |
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| 621.38152 BAC/F Fabrication of GaAs Devices/ | 621.38152 BHA/S Semiconductor optoelectronic devices / | 621.38152 BUB/P Photoelectronic properties of semiconductors / | 621.38152 CHI/S Semiconductor device and failure analysis: using photon emission microscopy/ | 621.38152 COL/C CMOS nanoelectronics: innovative devices, architectures and applications | 621.38152 FRA/A Advances in research and development : heterojunctions for high-speed and infrared applications/ | 621.38152 HOD/C Chemical solution deposition of semiconductor films / |
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