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Semiconductor device and failure analysis: using photon emission microscopy/ Wai Kin Chim

By: Material type: TextTextPublication details: Chichester: John Wiley & Sons, 2000Description: 269pISBN:
  • 9780471492405
Subject(s): DDC classification:
  • 621.38152 CHI/S
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics Non-fiction 621.38152 CHI/S (Browse shelf(Opens below)) Available DOP1308

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