Optical methods of measurement : wholefield techniques/ Rajpal S. Sirohi and Fook Siong Chau
Material type: TextPublication details: New York: Marcel Dekker Inc., 1999.Description: 323pISBN:- 0824760034
- 681.25
Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Book | Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 681.25 SIR/O (Browse shelf(Opens below)) | Available | DOP881 |
Browsing Dept. of Optoelectronics shelves, Shelving location: Processing Center, Collection: Non-fiction Close shelf browser (Hides shelf browser)
681.25 MAL/O Optical shop testing / | 681.25 NAR/O Optical sensors : industrial, environmental, and diagnostic applications / | 681.25 SAL/I Introduction to subsurface imaging / | 681.25 SIR/O Optical methods of measurement : wholefield techniques/ | 681.4 HRA/O Optical Workshop Technology/ | 681.4 KEM/M Microoptics and nanooptics fabrication / | 681.4 ORL/H Handbook of charged particle optics / |
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