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Next generation wireless LANs : throughput, robustness, and reliability in 802.11n / Eldad Perahia and Robert Stacey.
Material type:
TextPublication details: Cambridge, UK ; New York : Cambridge University Press, 2008.Description: xxx, 385 p. : illISBN: - 0521885841 (hbk.)
- 9780521885843 (hbk.)
- 621.398
| Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | |
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Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | Non-fiction | 621.398 PER/N (Browse shelf(Opens below)) | Available | DOP1858 |
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| 621.39732 SCH/N Nanometer CMOS/ | 621.39732 SHA/S Semiconductor memories : technology, testing, and reliability / | 621.39767 COU/H Holographic data storage / | 621.398 PER/N Next generation wireless LANs : throughput, robustness, and reliability in 802.11n / | 621.399 LUO/P Pattern recognition and image processing / | 621.399 YU/O Optical pattern recognition / | 621.47 DUF/S Solar Engineering of Thermal Processes/ |
Includes bibliographical references and index.
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