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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.

By: Material type: TextTextPublication details: New York, NY : Springer, c2005.Description: xii, 202 p. : illISBN:
  • 9780387258003
  • 0387258000
Subject(s): DDC classification:
  • 502.825
Online resources:
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode
Book Book Dept. of Optoelectronics Processing Center Dept. of Optoelectronics Non-fiction 502.825 EGE/P (Browse shelf(Opens below)) Available DOP1041

Includes bibliographical references (p. [195]-196) and index.

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