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Image analysis : applications in materials engineering / Leszek Wojnar.
Material type:
TextSeries: Publication details: Boca Raton, FL : CRC Press, c1999.Description: 245 p. : illISBN: - 0849382262 (alk. paper)
- 620.1102
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Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | 620.1102 WOJ/I (Browse shelf(Opens below)) | Available | DOP431 |
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| 620.11 SCH/S Smart materials / | 620.11 SELL Advanced magnetic nanostructures / | 620.11 SHA/I Intelligent materials / | 620.1102 WOJ/I Image analysis : applications in materials engineering / | 620.110285 Introduction to computational materials science : fundamentals to applications / | 620.110287 AMA/A Advances in materials characterization / | 620.110287 FLE/P1 Physical methods for materials characterisation / |
Includes bibliographical references (p. [227]-233) and index.
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