Advances in materials characterization / editors, G. Amarendra, Baldev Raj, M.H. Manghnani ; editor in-chief, Baldev Raj.
Material type:
TextSeries: Series in metallurgy and materials sciencePublication details: Hyderabad : Universities Press (India) : Distributed by Orient Longman ; Boca Raton, FL : Distributed by CRC Press, 2007.Description: 220 p. : ill. (some col.)ISBN: - 9788173715686
- 8173715688
- 620.110287
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Dept. of Optoelectronics Processing Center | Dept. of Optoelectronics | 620.110287 AMA/A (Browse shelf(Opens below)) | Available | DOP1285 |
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| 620.11 SHA/I Intelligent materials / | 620.1102 WOJ/I Image analysis : applications in materials engineering / | 620.110285 Introduction to computational materials science : fundamentals to applications / | 620.110287 AMA/A Advances in materials characterization / | 620.110287 FLE/P1 Physical methods for materials characterisation / | 620.110287 FLE/P2 Physical methods for materials characterisation / | 620.112 MEY/M Mechanical behavior of materials/ |
Includes bibliographical references and index.
MATERIAL CHARACTERIZATION--X RAY REFLECTIVITY--
Contributed articles moderated by Indian Institute of Metals.
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