In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.

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Material type: Text

TextPublication details: New York : Wiley, c2001.Description: xi, 263 p. : illISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Date due	Barcode
Book	Dept. of Optoelectronics Processing Center	Dept. of Optoelectronics	530.4275 AUC/T (Browse shelf(Opens below))	Available		DOP1311

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Previous	530.4175 STE/P The physics of thin film optical spectra : an introduction /	530.427 BOR/O Optics and spectroscopy at surfaces and interfaces /	530.4275 Nanostructured thin films and surfaces /	530.4275 AUC/T In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.	530.4275 BIR/T Thin film analysis by X-ray scattering /	530.4275 McC/B Birefringent thin films and polarizing elements / Martin W. McCall, Imperial College London, UK, Ian J. Hodgkinson, University of Otago, New Zealand, Qihong Wu, Finisar Australia, Australia..	530.4275 TOL/X X-ray scattering from soft-matter thin films : materials science and basic research /	Next

"A Wiley-Interscience publication."

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