Total-reflection X-ray fluorescence analysis and related methods / Reinhold Klockenkamper, Alex von Bohlen, Leibniz-Institut für Analytische Wissenschaften, ISAS e.V., Dortmund and Berlin, Germany.

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TextEdition: Second editionDescription: xvi, 519 pages : illustrations (some color)ISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Date due	Barcode
Book	Dept. of Optoelectronics Processing Center	Dept. of Optoelectronics	543.62 (Browse shelf(Opens below))	Available		DOP3133

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Previous	543.57 SUR Surface enhanced raman spectroscopy : Imperial College, London, 19-21 September 2005.	543.57 VAN/P Practical Raman spectroscopy : an introduction /	543.59 SIN/L Laser-induced breakdown spectroscopy /	543.62 Total-reflection X-ray fluorescence analysis and related methods /	543.62 ELL/E Electronic and photoelectron spectroscopy : fundamentals and case studies /	543.65 DOW/M Mass spectrometry : a foundation course /	543.66 GUN/N NMR sprctroscopy: Basic principle, concepts and applications in chemistry	Next

Includes bibliographical references and index.

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