Applied pattern recognition / Horst Bunke, Abraham Kandel, Mark Last, (eds.). Textual Documents

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Material type: Text

TextLanguage: English Series: Studies in computational intelligence ; 91Publication details: Berlin : Springer,(Ind Ed), c2008..Description: xi, 245 p. : ill. (some col.) ; 25 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode
Book	Dept. of Computer Science	Dept. of Computer Science	006.4 (Browse shelf(Opens below))	1	Available		DCS4246

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