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Statistical analysis of reliability and life-testing models : theory and methods / by Lee J Bain and Max Engelhardt

By: Contributor(s): Material type: TextTextPublication details: New York : Marcel Dekker, 1991.Edition: 2nd edDescription: 496pSubject(s): DDC classification:
  • 620.00452 BAI.S
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Holdings
Item type Current library Home library Collection Call number Copy number Status Date due Barcode
Book Book Campus Library Kariavattom Processing Center Campus Library Kariavattom 620.00452 BAI.S (Browse shelf(Opens below)) Available UCL09263
Book Book Dept. of Demography Processing Center Dept. of Demography 519.5 BAI/S (Browse shelf(Opens below)) Available DEM6145
Book Book Dept. of Statistics Reference Dept. of Statistics TRA 620.00452 BAI (Browse shelf(Opens below)) Not For Loan STA5825
Book Book Dept. of Statistics Processing Center Dept. of Statistics TRA 1 Not For Loan STA7393

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