Normal view MARC view ISBD view

Scanning electron microscopy: applications to materials and device science

Thornton, P R

Scanning electron microscopy: applications to materials and device science - - Chapman & Hall Ltd., London 1968 - 368 - .

ISBN:

Subjects--Topical Terms:
Scanning electron microscopy

Dewey Class. No.: 578.15 THO-S

Place hold
Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)