Classification, pattern recognition, and reduction of dimensionality /
Classification, pattern recognition, and reduction of dimensionality /
edited by P.R. Krishnaiah, L.N. Kanal.
- Amsterdam ; New York : New York, N.Y. : North-Holland Pub. Co. ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., c1982.
- xxii, 903 p. : ill. ;
Includes bibliographies and index.
044486217X
Discriminant analysis.
Cluster analysis.
Pattern perception.
519.535 / HAN.H
Includes bibliographies and index.
044486217X
Discriminant analysis.
Cluster analysis.
Pattern perception.
519.535 / HAN.H