Normal view MARC view ISBD view

Fault-tolerance and reliability techniques for high-density random-access memories /

Chakraborty, Kanad

Fault-tolerance and reliability techniques for high-density random-access memories / - New Delhi : PrenticeHall of India , 2002. - p.xix+462

ISBN: 8120322142

Subjects--Index Terms: Random Access Memorie

Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)